Free delivery for orders over 69.99 euro

Check order status

Become part of a community of book lovers from all over the world and get access to a whole bunch of benefits. Create an account for free

Free delivery for purchases over 69.99 €

DPD courier 4.49 € DPD point 3.99 € GLS courier 5.49 € GLS point 4.49 € Croatian Post 5.49 € Overseas courier 5.49 € Box Now 4.99 €

Contact

How to shop

Help

My account

▸ Empty :-(

Free delivery for orders over 69.99 euro

Scanning Electron Microscopy

Name: Scanning Electron Microscopy
Brand: NY RESEARCH PRESS
SKU: 12434612
Price: 126.24 EUR
Availability: InStock
Author: Lisa Page
ISBN: 9781632384065

Lisa Page

Language

English

Book Hardback

Libristo code: 12434612

Publishers NY RESEARCH PRESS, March 2015

Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments empl... Full description

Libristo code: 12434612

307 b

126.24 €

50 % chance We search the world When will I receive my book?

Up to 30 days for returns

Customers also purchased

Un dulce rubor Gil Benítez

Paperback

25.35 €

agatha moon et autres gourmandises pasini

Hardback

25.15 €

Le Programmeur pragmatique Andrew Hunt

Paperback

41.55 €

Procédures fiscales Thierry Lambert

Paperback

52.52 €

Cartes Oui, je peux (Coffret) Louise Hay

Hardback

26.16 €

La valse de l'adieu Philippe de Villiers

Paperback

26.16 €

Kazimierz Dolny Lublin i okolice Travelbook Bodnari Magdalena

Paperback

4.82 €

Pilates per la riabilitazione. Recuperare dagli infortuni e ottimizzare la funzionalità Samantha Wood

Paperback

38.23 €

Mytologická zvířata Tam O'Malleyová

Hardback

7.84 €

Porträt des Meisters in mittleren Jahren Colm Toibin

Paperback

14.68 €

Lída Baarová Návraty Jiří Tauchen

Hardback

2.91 €

Zwingli Aimé Richardt

Paperback

21.22 €

L'arabe langue vivante Volume 3 Hamida Atoui

Book

19.01 €

Sadako Koji Suzuki

Paperback

9.45 €

Hermann Et Emilie. Tome 1 August Lafontaine

Paperback

24.75 €

Antike Portrats Richard Delbrueck

Paperback

19.71 €

Benny Blu - Wale Christiane Neumann

Sheet

4.32 €

Mein amerikanischer alpTraum Karl-Heinz Bergbauer

Hardback

20.52 €

Traite Pratique de Magnetisme Humain, Ou Resume de Tous Les Principes Et Procedes Du Magnetisme ROUGET-F

Paperback

18.71 €

Traite Pratique Des Douanes. Tome 2 DELANDRE-A

Paperback

36.92 €

Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical aspects. Numerous topics are organized under two sections, "Material Science" and "Nanostructured Materials for Electronic Industry". This book includes contributions by renowned researchers and experts in this field.