Kontakt
Kako kupovati
Dostava
Savjetnik za kupnju
Analog IC Reliability in Nanometer CMOS
Engleski
249 b
Do 30 dana za povrat
Kupci su kupili i
/
Meki uvez
44.02
€
/
Kalendar
19.54
€
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. §The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs. §· Enables readers to understand long-term reliability of an integrated circuit;§· Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes;§· Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology;§· Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.
Informacije o knjizi
Engleski
Poklonite ovu knjigu još danas
To je jednostavno
1 Dodajte knjigu u košaricu i odaberite isporuku kao poklon 2 Zauzvrat ćemo vam poslati kupon 3 Knjiga dolazi na adresu poklonoprimcaMoglo bi vas zanimati i
/
Meki uvez
13.90
€
/
Meki uvez
16.62
€
/
Meki uvez
99.74
€
/
Adobe ePub DRM
0.90
€
/
Meki uvez
12.08
€
/
Meki uvez
99.14
€
Dobar dan! Ja sam Libroamiko, vaš književni savjetnik.
Kako vam mogu pomoći?