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$Knjiga High Resolution X-Ray Diffractometry And Topography D. Keith Bowen$

High Resolution X-Ray Diffractometry And Topography

Name: High Resolution X-Ray Diffractometry And Topography
Brand: Taylor & Francis Ltd
SKU: 24622344
Price: 99.95 EUR
Availability: InStock
Author: D. Keith Bowen
ISBN: 9780367400637

D. Keith Bowen

Brian K. Tanner

Jezik

Engleski

Knjiga Meki uvez

$Knjiga High Resolution X-Ray Diffractometry And Topography D. Keith Bowen$

Libristo kod: 24622344

Nakladnici Taylor & Francis Ltd, listopad 2019

The study and application of electronic materials has created an increasing demand for sophisticated... Cijeli opis

Libristo kod: 24622344

242 b

99.95 €

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The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern tec