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Surface Roughness Study by Atomic Force Microscopy

Name: Surface Roughness Study by Atomic Force Microscopy
Brand: LAP Lambert Academic Publishing
SKU: 07085730
Price: 47.42 EUR
Availability: InStock
Author: Md.Abu Sayeed
ISBN: 9783848400355

Surface Roughness-Practical Example

Md.Abu Sayeed

Zakia Ferdous

Jezik

Engleski

Knjiga Meki uvez

Libristo kod: 07085730

Nakladnici LAP Lambert Academic Publishing, veljača 2012

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capab... Cijeli opis

Libristo kod: 07085730

115 b

47.42 €

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AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.